Technical Bases for the Dwpf Testing Program
نویسندگان
چکیده
منابع مشابه
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15 صفحه اولMessage from the Technical Program Co-Chairs
On behalf of the Technical Program Committee, welcome to the 31st Annual Conference of the IEEE Industrial Electronics Society. IECON is one of the foremost international conferences on the advancements of industrial electronics and its applications. It is therefore an honor and a great pleasure for us to be responsible for the Technical Program of IECON'05. It represents the integrated effort ...
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ژورنال
عنوان ژورنال: MRS Proceedings
سال: 1990
ISSN: 0272-9172,1946-4274
DOI: 10.1557/proc-212-159